PDF) The Test Access Port and Boundary-Scan Architecture
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IEEE 1149.1:IEEE Standard Test Access Port and Boundary Scan Architecture: Colin M. Maunder, Rodham E. Tulloss: 9780738182636: Amazon.com: Books
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VLSI
IEEE 1149.1:IEEE Standard Test Access Port and Boundary Scan Architecture: Colin M. Maunder, Rodham E. Tulloss: 9780738182636: Amazon.com: Books
Boundary Scan - an overview | ScienceDirect Topics
Boundary scan - Wikiwand
